Error correction Archives - IEEE Transactions on Quantum Engineering

Improved Belief Propagation Decoding Algorithms for Surface Codes

June 6, 2025Jiahan Chen; Zhengzhong Yi; Zhipeng Liang; Xuan WangUncategorizedAccuracy, Belief propagation, Codes, Complexity theory, Error correction, Maximum likelihood decoding, Noise, Qubit, Silicon, Time complexity

Abstract: Quantum error correction is crucial for universal fault-tolerant quantum computing. Highly accurate and low-time-complexity decoding algorithms play an indispensable role in ensuring quantum error correction works effectively. Among existing decoding algorithms, belief propagation (BP) is notable for its nearly linear time complexity and general applicability to stabilizer codes. However, BP’s decoding accuracy without postprocessing […]

Reducing Quantum Error Correction Overhead With Versatile Flag-Sharing Syndrome Extraction Circuits

May 13, 2025Pei-Hao Liou; Ching-Yi LaiQuantum Computing, UncategorizedCircuits, Codes, Decoding, Error correction, Fault tolerance, Fault tolerant systems, Logic gates, Measurement uncertainty, Quantum computing, Qubit

Abstract: Given that quantum error correction processes are unreliable, an efficient error syndrome extraction circuit should use fewer ancillary qubits, quantum gates, and measurements while maintaining low circuit depth, to minimize the circuit area, roughly defined as the product of circuit depth and the number of physical qubits. We propose to design parallel flagged syndrome […]

Improved Gilbert–Varshamov Bound for Entanglement-Assisted Asymmetric Quantum Error Correction by Symplectic Orthogonality

April 22, 2020Ryutaroh MatsumotoOpen Access, Quantum InformationError correction, Error correction codes, Indexes, Licenses, Quantum computing, Quantum entanglement

We propose and prove an existential theorem for entanglement-assisted asymmetric quantum error correction. Then, we demonstrate its superiority over the conventional one. For more about this transaction see link below. https://ieeexplore.ieee.org/document/9076251