Quantum Sensing & Metrology Archives - IEEE Transactions on Quantum Engineering

Thin Film Materials for Room Temperature Quantum Applications

Thin films with quantum defects are emerging as a potential platform for quantum applications. Quantum defects in some thin films arise due to structural imperfections, such as vacancies or impurities. These defects generate localized electronic states with unique optical and electronic properties. Crystal vacancies or defects that occur when atoms are missing from a crystal […]

Machine-Learning-Based Parameter Estimation of Gaussian Quantum States

November 2, 2022Neel Kanth KunduOpen Access, Quantum Sensing & MetrologyBayes methods, Estimation, Machine learning, Metrology, Parameter estimation, Phase estimation, Quantum state

In this article, we propose a machine-learning framework for parameter estimation of single-mode Gaussian quantum states. Under a Bayesian framework, our approach estimates parameters of suitable prior distributions from measured data. For phase-space displacement and squeezing parameter estimation, this is achieved by introducing expectation–maximization (EM)-based algorithms, while for phase parameter estimation, an empirical Bayes method […]