Editor-in-Chief:
Britton Plourde, Syracuse University, Syracuse, NY, USA
Editors:
Photo of Yuri Alexeev Yuri Alexeev, Argonne National Laboratory, Lemont, IL, USA
Michele Amoretti, University of Parma, Parma, Italy
Photo of Joseph-Bardin Joseph Bardin, University of Massachusetts Amherst, MA, USA and Google, Goleta, CA, USA
 Sara-Cacciapuoti Angela Sara Cacciapuoti, University of Naples Federico II, Naples, Italy
Marcelo Caleffi, University of Naples Federico II, Naples, Italy
Davide-Calonicoi Davide Calonico, Istituto Nazionale di Ricerca Metrologica,Turin, Italy
Ryan Camacho, Brigham Young University, Provo, UT, USA
Ruonan Han, Massachusetts Institute of Technology, Cambridge, MA, USA
Yang Hao, Queen Mary University of London, UK
Peng Li, Auburn University, Auburn, AL, USA
Adriana E. Lita, National Institute of Standards and Technology, Boulder, CO,  USA
Oleg Mukhanov, SeeQC, Inc., Elmford, NY, USA
Serkay Ölmez, Seagate Technology, Longmont, CO, USA
Alexandru Paler, Johannes Kepler University Linz, Austria
Daniel Slichter, National Institute of Standards and Technology, Boulder, CO, USA
Photo of Andrew Sornborger Andrew Sornborger, Information Sciences CCS-3, Los Alamos National Laboratory, Los Alamos, NM, USA
Photo of Rodney Van Meter Rodney Van Meter, Professor, Faculty of Environment and Information Studies, Keio University, Japan