Editor-in-Chief:
Rodney Van Meter, Professor, Faculty of Environment and Information Studies, Keio University, Japan
Editors:
Photo of Yuri Alexeev Yuri Alexeev, Argonne National Laboratory, Lemont, IL, USA
Michele Amoretti, University of Parma, Parma, Italy
Photo of Joseph-Bardin Joseph Bardin, University of Massachusetts Amherst, MA, USA and Google, Goleta, CA, USA
 Sara-Cacciapuoti Angela Sara Cacciapuoti, University of Naples Federico II, Naples, Italy
Marcello Caleffi, University of Naples Federico II, Naples, Italy
Davide-Calonicoi Davide Calonico, Istituto Nazionale di Ricerca Metrologica, Turin, Italy
Ryan Camacho, Brigham Young University, Provo, UT, USA
Ruonan Han, Massachusetts Institute of Technology, Cambridge, MA, USA
Yang Hao, Queen Mary University of London, UK
Peng Li, University of Science and Technology of China, Hefei, China
Adriana E. Lita, National Institute of Standards and Technology, Boulder, CO,  USA
Anne Matsuura, Intel Labs, Portland, OR, USA
Oleg Mukhanov, SeeQC, Inc., Elmford, NY, USA
Serkay Ölmez, Seagate Technology, Longmont, CO, USA
Alexandru Paler, Aalto University, Espoo, Finland
Daniel Slichter, National Institute of Standards and Technology, Boulder, CO, USA