Voltage measurement Archives - IEEE Transactions on Quantum Engineering

Generating Shuttling Procedures for Constrained Silicon Quantum Dot Array

In silicon quantum computers, a single electron is trapped in a microstructure called a quantum dot, and its spin is used as a qubit. For large-scale integration of qubits, we previously proposed an approach of sharing a control gate in the row or column of a 2-D quantum dot array. In our array, the shuttling […]

Novel Trade-offs in 5 nm FinFET SRAM Arrays at Extremely Low Temperatures

December 5, 2024Shivendra Singh Parihar, Girish Pahwa, Baker Mohammad, Yogesh Singh Chauhan, Hussam AmrouchEnabling TechnologiesCircuits, Cryogenics, Electrical resistance measurement, FinFETs, Optimization, Random access memory, Resistance, Transistors, Voltage measurement, Wire

Complementary metal–oxide–semiconductor (CMOS)-based computing promises drastic improvement in performance at extremely low temperatures (e.g., 77 K, 10 K). The field of extremely low temperature CMOS-environment-based computing holds the promise of delivering remarkable enhancements in both performance and power consumption. Static random access memory (SRAM) plays a major role in determining the performance and efficiency of […]